C-Ray is an advanced capacitive sensor technology developed for precise thickness measurement. We have developed our internal capacitive technology with its sensor geometry. It allows us to provide enhanced quality control and measurement accuracy across various applications.
C-Ray utilizes robust capacitive technology with integrated variable-stand-off compensation. This enables accurate thickness measurement with a minimal stand-off distance of approximately 4 millimeters (157 mils). C-Ray is designed to measure thin films with high precision, even in challenging conditions. It excels in measuring materials ranging from 20 micrometers to 4 millimeters (0.78 mils to 157 mils) in thickness, including both opaque and non-opaque sheets, films, and foams.
C-Ray technology is exceptionally well-suited for thin-film plastics extrusion lines, where space is often limited and cost-efficiency is crucial. Its compact design and precise measurement capabilities make it an ideal choice for in-line quality control.
